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PARK NX-HDM - The Best AFM for automatic defect review and surface roughness measurement
Higher Throughput, Automatic Defect Review
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput.
Sub-Angstrom, Surface Roughness Measurement
Increasingly, industries require ultra-flat media and substrate to address the ever-shrinking device dimensions. Park NX-HDM provides accurate sub-angstrom surface roughness measurements, scan after scan. Park NX-HDM, together with its industry?s lowest noise floor, and its unique True Non-Contact? technology, it is the most accurate AFM for surface roughness measurement in the market.
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