{"id":485,"date":"2025-07-23T01:38:46","date_gmt":"2025-07-23T01:38:46","guid":{"rendered":"https:\/\/snowhouse.ca\/produit\/skp470-scanning-kelvin-probe-system\/"},"modified":"2025-11-14T15:45:46","modified_gmt":"2025-11-14T15:45:46","slug":"skp470-scanning-kelvin-probe-system","status":"publish","type":"product","link":"http:\/\/snowhouse.ca\/fr\/produit\/material-characterization\/scanning-electrochemical-workstation\/skp470-scanning-kelvin-probe-system\/","title":{"rendered":"SKP \u2013 M470"},"content":{"rendered":"

SKP \u2013 M470.<\/span><\/h3>\n

Cette technique utilise une sonde capacitive vibrante de conception connue pour mesurer la diff\u00e9rence de fonction de travail avec l'\u00e9chantillon \u00e9tudi\u00e9.<\/h3>\n

<\/h3>\n

Cartographier les variations locales du travail de sortie \u00e0 la surface d'un \u00e9chantillon<\/h3>\n

La technique de la sonde Kelvin \u00e0 balayage (SKP) utilise une sonde capacitive vibrante de conception connue pour mesurer la diff\u00e9rence de potentiel de sortie de l'\u00e9chantillon. En d\u00e9pla\u00e7ant la sonde dans le plan x,y, il est possible de cartographier les variations locales du potentiel de sortie \u00e0 la surface de l'\u00e9chantillon. Cette diff\u00e9rence de potentiel de sortie est li\u00e9e \u00e0 une caract\u00e9ristique de l'\u00e9tat de surface, notamment le potentiel de corrosion. Avec le m\u00eame dispositif, il est \u00e9galement possible de r\u00e9aliser deux types de mesures topographiques\u00a0: la mesure de hauteur capacitive (CHM) et la mesure de suivi capacitif (CTM). La CHM et la CTM peuvent \u00eatre utilis\u00e9es seules ou comme donn\u00e9es d'entr\u00e9e pour une mesure de suivi de hauteur.<\/p>\n

La technique SKP est largement utilis\u00e9e dans la recherche sur la corrosion et les rev\u00eatements. Elle est particuli\u00e8rement utile pour \u00e9tudier l'amor\u00e7age de la corrosion sous un rev\u00eatement de surface. Dans le domaine du photovolta\u00efque, l'utilisation de la technique SKP s'est accrue pour d\u00e9terminer le travail de sortie de diff\u00e9rents composants. Elle a \u00e9galement \u00e9t\u00e9 employ\u00e9e pour d\u00e9tecter la contamination de surface des composants. En biotechnologie, la technique SKP a \u00e9t\u00e9 propos\u00e9e pour mesurer le potentiel \u00e9lectrique des tissus vivants et a m\u00eame trouv\u00e9 des applications en criminalistique.<\/p>\n

 <\/p>\n

\"\"<\/a><\/p>\n

Mesure SKP \u00e0 distance constante d'une pi\u00e8ce de 2 \u20ac effectu\u00e9e en mode de suivi de hauteur \u00e0 l'aide des mesures topographiques du MTC.<\/p>\n

 <\/p>\n

Aper\u00e7u\u00a0: Mesures de la fonction de travail locale sans contact et non destructives<\/h3>\n
    \n
  • Non destructif<\/li>\n
  • Peut \u00eatre utilis\u00e9 m\u00eame en pr\u00e9sence d'un rev\u00eatement isolant.<\/li>\n<\/ul>\n

    Mesurez votre \u00e9chantillon sans exposition \u00e0 l'\u00e9lectrolyte.<\/h3>\n

    L'exposition prolong\u00e9e d'un \u00e9chantillon \u00e0 l'\u00e9lectrolyte peut l'endommager. Si l'\u00e9chantillon est susceptible de se corroder au contact de l'\u00e9lectrolyte, son \u00e9tat pourrait diff\u00e9rer entre le d\u00e9but et la fin de l'exp\u00e9rience. Contrairement \u00e0 d'autres mesures par sonde \u00e0 balayage, la technique SKP est r\u00e9alis\u00e9e sans \u00e9lectrolyte, tout en fournissant des informations \u00e9lectrochimiques sur l'\u00e9chantillon. Technique sans contact et sans \u00e9lectrolyte, la SKP est une mesure v\u00e9ritablement non destructive.<\/p>\n

    La fonction d'auto-r\u00e9glage permet une mise en place exp\u00e9rimentale plus rapide<\/h3>\n

    Dans la technique SKP, la sonde vibre perpendiculairement \u00e0 l'\u00e9chantillon pour g\u00e9n\u00e9rer un courant alternatif sinuso\u00efdal. Ce courant est ensuite converti en courant continu par l'amplificateur de d\u00e9tection synchrone (LIA) gr\u00e2ce \u00e0 un signal de d\u00e9modulation. Pour un signal continu maximal, ce signal doit \u00eatre en phase. Le choix de la phase de d\u00e9modulation peut s'av\u00e9rer complexe pour un utilisateur novice. Le SKP470 simplifie cette \u00e9tape gr\u00e2ce \u00e0 sa fonction d'auto-r\u00e9glage, ce qui acc\u00e9l\u00e8re et facilite la mise en place de l'exp\u00e9rience. De plus, la phase optimale pour un signal continu maximal est toujours garantie.<\/p>\n

    Effectuer des mesures \u00e0 hauteur constante et \u00e0 distance constante<\/h3>\n

    Le SKP470 permet aux chercheurs d'effectuer des mesures SKP en modes hauteur constante et distance constante. Le mode hauteur constante offre les mesures SKP les plus rapides, car la position z de la sonde reste inchang\u00e9e pendant le balayage. Cependant, la distance sonde-\u00e9chantillon influe sur la qualit\u00e9 et l'intensit\u00e9 du signal SKP\u00a0; il est donc avantageux de maintenir la sonde pr\u00e8s de la surface de l'\u00e9chantillon tout au long du balayage. Dans ce cas, les mesures \u00e0 distance constante par suivi de hauteur, o\u00f9 la position z de la sonde varie, constituent le meilleur choix.<\/p>\n

    Choisissez parmi deux techniques de topographie SKP diff\u00e9rentes<\/h3>\n

    Le SKP470 offre deux options pour la mesure de la topographie. Les chercheurs peuvent ainsi effectuer un balayage topographique, suivi d'une mesure SKP \u00e0 distance constante, sans changer de sonde ni proc\u00e9der \u00e0 un nouvel alignement. Les deux mesures topographiques disponibles sont la mesure de hauteur capacitive (CHM) et la mesure de suivi capacitif (CTM). En CHM, la sonde conserve une hauteur constante et seule la variation de distance entre la sonde et l'\u00e9chantillon est mesur\u00e9e. Cette m\u00e9thode est adapt\u00e9e aux \u00e9chantillons relativement plats, n\u00e9cessitant une mesure topographique rapide. En CTM, la hauteur de la sonde varie tout au long de la mesure afin de maintenir une distance sonde-\u00e9chantillon constante. Cette m\u00e9thode est particuli\u00e8rement adapt\u00e9e aux \u00e9chantillons tr\u00e8s rugueux ou pr\u00e9sentant d'importantes variations de topographie.<\/p>","protected":false},"excerpt":{"rendered":"

    Technique de la sonde Kelvin \u00e0 balayage (SKP)<\/p>","protected":false},"featured_media":486,"template":"","meta":[],"product_brand":[550],"product_cat":[84],"product_tag":[],"document":[392],"class_list":{"0":"post-485","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_brand-biologic","7":"product_cat-scanning-electrochemical-workstation","8":"document-https-affichez-vous-com-pdf-biologic-m470-scanning-system-2-pdf","10":"first","11":"instock","12":"purchasable","13":"product-type-simple"},"yoast_head":"\nSKP - M470 - SnowHouse<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/snowhouse.ca\/fr\/produit\/material-characterization\/scanning-electrochemical-workstation\/skp470-scanning-kelvin-probe-system\/\" \/>\n<meta property=\"og:locale\" content=\"fr_CA\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"SKP - 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