{"id":558,"date":"2025-07-23T01:39:30","date_gmt":"2025-07-23T01:39:30","guid":{"rendered":"https:\/\/snowhouse.ca\/produit\/4-ct-100\/"},"modified":"2025-11-24T21:48:28","modified_gmt":"2025-11-24T21:48:28","slug":"4-ct-100","status":"publish","type":"product","link":"http:\/\/snowhouse.ca\/fr\/produit\/material-characterization\/3d-optical-profilometer\/4-ct-100\/","title":{"rendered":"CT 150"},"content":{"rendered":"

CT 15<\/strong>0 \u2013 Syst\u00e8me de m\u00e9trologie compact pour la R&D et les laboratoires<\/strong><\/h3>\n
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Zone de mesure :<\/strong> 148 x 148 mm\u00b2<\/p>\n

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Exemples de cas d'utilisation\u00a0:<\/strong> Substrats, composants \u00e9lectroniques, plaquettes jusqu'\u00e0 6 pouces, autres pi\u00e8ces et composants dans la zone de mesure<\/p>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n<\/div>\n

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M\u00e9trologie de table avanc\u00e9e<\/h3>\n<\/div>\n<\/div>\n
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Le CT150 est une solution id\u00e9ale pour les laboratoires de R&D et d'analyse des d\u00e9faillances. Sa conception adaptable permet l'int\u00e9gration de plusieurs capteurs dans un seul syst\u00e8me, prenant en charge un large \u00e9ventail d'applications.<\/p>\n

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Compact Metrology System<\/p>","protected":false},"featured_media":2640,"template":"","meta":[],"product_brand":[556],"product_cat":[88],"product_tag":[],"document":[],"class_list":{"0":"post-558","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_brand-cyber-technologies","7":"product_cat-3d-optical-profilometer","9":"first","10":"instock","11":"purchasable","12":"product-type-simple"},"yoast_head":"\nCT 150 - SnowHouse<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/snowhouse.ca\/fr\/produit\/material-characterization\/3d-optical-profilometer\/4-ct-100\/\" \/>\n<meta property=\"og:locale\" content=\"fr_CA\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"CT 150 - SnowHouse\" \/>\n<meta property=\"og:description\" content=\"Compact Metrology System\" \/>\n<meta property=\"og:url\" content=\"https:\/\/snowhouse.ca\/fr\/produit\/material-characterization\/3d-optical-profilometer\/4-ct-100\/\" \/>\n<meta property=\"og:site_name\" content=\"SnowHouse\" \/>\n<meta property=\"article:modified_time\" content=\"2025-11-24T21:48:28+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/snowhouse.ca\/wp-content\/uploads\/2025\/07\/CT150-framed.png\" \/>\n\t<meta property=\"og:image:width\" content=\"800\" \/>\n\t<meta property=\"og:image:height\" content=\"650\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/png\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Estimation du temps de lecture\" \/>\n\t<meta name=\"twitter:data1\" content=\"1 minute\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/snowhouse.ca\/fr\/produit\/material-characterization\/3d-optical-profilometer\/4-ct-100\/\",\"url\":\"https:\/\/snowhouse.ca\/fr\/produit\/material-characterization\/3d-optical-profilometer\/4-ct-100\/\",\"name\":\"CT 150 - 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