News
- 14 July 2014
- Lac-Beauport, SnowHouse Solutions has reached an agreement with cyberTECHNOLOGIES (www.cybertechnologies.com) to promote... read more
- 24 Jan 2014
- January 24 2014
Lac-Beauport, SnowHouse Solutions has reached an agreement with Resolution Spectra (
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Products
(204 items / page 6 of 23)
- 5. Shamrock 750 Spectrograph
#Shamrock 750 Shamrock 750 Spectrograph Pre-aligned, pre-calibrated detection solutions The Andor Shamrock SR-750 is the latest addition of the Andor family of spectrographs based on Czerny-Turner optical design. The Shamrock is available as a pre-aligned detector/spectrometer option allowing for seamless... - 6. CT 350S
#CT 350S CT 350S - Non-Contact Profilometer - Large 350 mm x 350 mm scanning area - Large z-range at high resolution using a closed loop axis - User friendly - Sophisticated analysis and automation software The CT 350S is a non-contact profilometer with a 350 mm x-, y-scanning stage and a closed loop... - 6. Mechelle 5000 Spectrograph
#Mechelle 5000 Mechelle 5000 Spectrograph The Best Price Performance Echelle Spectrograph Ever! Andor's new Mechelle ME5000 Echelle spectrograph has been designed to provide simultaneous recording of a wide wavelength range (200-975 nm) in one acquisition. It has no moving components is available in a pre-aligned... - 7. CT 350T / Ct 250T
#CT 350T / Ct 250T CT 350T / CT 250T - Non-Contact Double-Sided Optical Profilometer - Scanning Range: up to 300 x 300 mm - Dual non-contact measurement system - 3D mapping of thickness, bow, warpage and rouhgness - User friendly concept - Sophisticated analysis and automation software The CT 350T is a non-contact... - 8. CT 600S
#CT 600S CT 600S - Non-Contact Profilometer - Large 600 mm x 600 mm scanning area - High accurate measurements on large and heavy parts - User friendly concept - Sophisticated analysis and automation software The CT 600S is a non-contact profilometer with a 600 mm x-, y-motion system. The gantry design... - 9. CT R200
#CT R200 CT R200 - Non-Contact profilometer w Rotary Stage - High-Speed surface measurement on round parts - For diameters from 5 mm to 200 mm - User friendly concept - Sophisticated analysis and automation software The CT R200 is a non-contact profilometer with a rotary stage, a 200 mm x-axis, and... - ac-SDS/SDS470 Alternative Current Scanning Droplet System
#ac-SDS/SDS470 ac-SDS/SDS470 Alternative Current Scanning Droplet System Ability to spatially resolve the electrochemical behaviour of phases contained in metallic samples The Scanning Droplet System uses a Scanning Droplet Cell (SDC) that allows a spatially resolved, in situ investigation by all standard... - ac-SECM/SECM470 Alternative Current Scanning Electrochemical Microscope System
#ac- SECM/SECM470 ac-SECM/SECM470 Alternative Current Scanning Electrochemical Microscope System Provides information about the surface reactivity of a sample in solution. SECM is one of the fastest growing of the scanning probe electrochemistry techniques. Its many application areas include the study of surface... - AFM-IR - VISTA 75 - PiFM and PiF-IR with s-SNOM
#AFM-IR - PiFM - Vista 75 Vista 75IR-PiFM - PiF-IR - AFM-IRSub 5 nm IR spatial resolution ? Single-molecule-level sensitivity Accessible design - Easy sample access and a one handedAFM head clamp make tip and sample exchanges a breeze Quick-change optics - Pre-aligned optics make switching between PiFM + PiF-IR,...
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