Description
Andor iKon-M/L SO Series
Andor’s iKon series offers outstanding sensitivity performance through a combination of > 95% QE back-illuminated sensors, low noise readout electronics and industry-leading, maintenance-free deep TE-cooling down to -100°C. It features high resolution 1 and 4.2 Megapixel large area sensor options (with 13 and 13.5 μm pixels respectively) for simultaneous high dynamic range and high spatial resolution imaging in the VUV and soft x-ray range.
A convenient 16-point, knife-edge sealed 6” rotatable CF-152 flange provides a robust and highly effective seal to any compatible vacuum chamber interface. The iKon-M and -L also offer a USB2 interface and Labview or EPICS compatibility for seamless integration into complex setups.
Features
- 1 MP or large area 4.2 MP sensors
- Peak QE up to 95% (soft x-ray region)
- High resolution 13 or 13.5 µm pixels
- TE-cooling down to -100°C
- Readout noise as low as 2.9 e
- Labview and EPICS compatibility
- USB 2.0 Interface
Applications
- VUV/EUV/XUV Imaging
- X-Ray Imaging & Microscopy
- X-Ray Diffraction (XRD)X-Ray Plasma Imaging
- X-Ray source characterization
- X-Ray Phase Contrast Imaging
- High Harmonic Generation (HHG)
