{"id":491,"date":"2025-07-23T01:39:10","date_gmt":"2025-07-23T01:39:10","guid":{"rendered":"https:\/\/snowhouse.ca\/produit\/ic-secm470-intermittent-contact-scanning-electrochemical-microscopy\/"},"modified":"2025-11-14T15:31:18","modified_gmt":"2025-11-14T15:31:18","slug":"ic-secm470-intermittent-contact-scanning-electrochemical-microscopy","status":"publish","type":"product","link":"https:\/\/snowhouse.ca\/fr\/produit\/material-characterization\/scanning-electrochemical-workstation\/ic-secm470-intermittent-contact-scanning-electrochemical-microscopy\/","title":{"rendered":"ic-SECM \u2013 M470"},"content":{"rendered":"<h2><strong>Technique ic-SECM pour M470<br \/>\nMicroscopie \u00e9lectrochimique \u00e0 balayage par contact intermittent<\/strong><\/h2>\n<h3><strong>SECM avec la capacit\u00e9 de distinguer la r\u00e9ponse induite topographique et \u00e9lectrochimique<\/strong><\/h3>\n<p>La variante de microscopie \u00e9lectrochimique \u00e0 balayage par contact intermittent du syst\u00e8me modulaire de BioLogic\u00a0<a href=\"https:\/\/biologic.net\/products\/m470\/\">M470<\/a>\u00a0Station de travail \u00e9lectrochimique \u00e0 balayage. Il s&#039;agit d&#039;une technique exclusive \u00e0 BioLogic.<\/p>\n<p>La microscopie \u00e9lectrochimique \u00e0 balayage par contact intermittent (ic-SECM) est une m\u00e9thode de microscopie \u00e9lectrochimique \u00e0 balayage (SECM) \u00e0 distance constante. Gr\u00e2ce \u00e0 l&#039;ic-SECM, il est possible de mesurer l&#039;activit\u00e9 de surface et d&#039;\u00e9tablir des cartes topographiques de surface. Cette exp\u00e9rience unique permet de corr\u00e9ler les caract\u00e9ristiques et l&#039;activit\u00e9 de l&#039;\u00e9chantillon.<\/p>\n<p>La technique ic-SECM est uniquement disponible sur la station de travail \u00e9lectrochimique \u00e0 balayage M470 de BioLogic (sous licence exclusive du groupe Unwin).\u00a0<a href=\"https:\/\/warwick.ac.uk\/fac\/sci\/chemistry\/research\/unwin\/electrochemistry\">Universit\u00e9 de Warwick<\/a>).<\/p>\n<p>L&#039;utilisation de la microscopie \u00e9lectrochimique \u00e0 balayage (SECM) \u00e0 haute r\u00e9solution permet de maintenir une distance constante entre la sonde et l&#039;\u00e9chantillon sur de grandes surfaces, m\u00eame sur des \u00e9chantillons tr\u00e8s rugueux. Elle a \u00e9t\u00e9 employ\u00e9e pour mesurer des \u00e9chantillons extr\u00eamement plats afin de s&#039;affranchir de l&#039;inclinaison et garantir ainsi un signal optimal tout au long de la mesure. La SECM \u00e0 haute r\u00e9solution est utilis\u00e9e dans la recherche sur les batteries, notamment pour la mesure des \u00e9lectrolytes solides. Elle peut \u00e9galement servir dans l&#039;\u00e9tude de la corrosion, en particulier lorsque l&#039;\u00e9chantillon est trop rugueux pour \u00eatre analys\u00e9 par les techniques SECM \u00e0 hauteur constante.<\/p>\n<h3>Aper\u00e7u : Un syst\u00e8me puissant, polyvalent et facile \u00e0 utiliser<\/h3>\n<ul>\n<li>Mesurer simultan\u00e9ment l&#039;activit\u00e9 de surface et la topographie<\/li>\n<li>Utilisation d&#039;un bouton-poussoir pour d\u00e9tecter automatiquement la surface de l&#039;\u00e9chantillon<\/li>\n<li>L&#039;inclinaison de l&#039;\u00e9chantillon n&#039;est plus un probl\u00e8me.<\/li>\n<li>Disponible pour les mod\u00e8les dc-SECM et ac-SECM<\/li>\n<li>Des signaux plus forts<\/li>\n<\/ul>\n<h3><strong>Mesure SECM \u00e0 distance constante unique avec sorties d&#039;activit\u00e9 et de topographie<\/strong><\/h3>\n<p>La microscopie \u00e9lectrochimique \u00e0 balayage (SECM) \u00e0 hauteur constante est la m\u00e9thode la plus courante. Cependant, comme l&#039;activit\u00e9 de l&#039;\u00e9chantillon et la distance sonde-\u00e9chantillon influencent le signal SECM, il peut \u00eatre difficile de d\u00e9terminer si le signal mesur\u00e9 provient de l&#039;activit\u00e9 ou de la topographie. Ceci peut limiter les types et les tailles d&#039;\u00e9chantillons adapt\u00e9s \u00e0 la SECM \u00e0 hauteur constante. En revanche, avec la SECM \u00e0 intensit\u00e9 variable (ic-SECM), la topographie est suivie tout au long de la mesure, ce qui permet d&#039;affirmer avec certitude que le signal mesur\u00e9 est d\u00fb \u00e0 l&#039;activit\u00e9 de l&#039;\u00e9chantillon. L&#039;ic-SECM permet ainsi d&#039;utiliser des \u00e9chantillons auparavant inaccessibles \u00e0 la SECM traditionnelle. L&#039;ic-SECM ouvre la voie \u00e0 la mesure de surfaces beaucoup plus grandes qu&#039;avec les m\u00e9thodes traditionnelles, car l&#039;inclinaison de l&#039;\u00e9chantillon est prise en compte, \u00e9vitant ainsi la d\u00e9gradation du signal. De plus, la topographie \u00e9tant mesur\u00e9e s\u00e9par\u00e9ment, une corr\u00e9lation entre la topographie et l&#039;activit\u00e9 est possible.<\/p>\n<p><a href=\"https:\/\/biologic.net\/wp-content\/uploads\/2019\/08\/ic-secm_activity_example.jpg\"><img fetchpriority=\"high\" decoding=\"async\" class=\"alignnone size-full wp-image-10762\" src=\"https:\/\/biologic.net\/wp-content\/uploads\/2019\/08\/ic-secm_activity_example.jpg\" alt=\"\" width=\"418\" height=\"344\" \/><\/a>\u00a0<a href=\"https:\/\/biologic.net\/wp-content\/uploads\/2019\/08\/ic-secm_topography_example.jpg\"><img decoding=\"async\" class=\"alignnone size-medium wp-image-10763\" src=\"https:\/\/biologic.net\/wp-content\/uploads\/2019\/08\/ic-secm_topography_example.jpg\" alt=\"\" width=\"300\" height=\"242\" \/><\/a><\/p>\n<h3><strong>Aucune courbe d&#039;approche requise<\/strong><\/h3>\n<p>En ic-SECM, l&#039;utilisateur peut proc\u00e9der par simple pression d&#039;un bouton pour localiser automatiquement la surface de l&#039;\u00e9chantillon. Cette m\u00e9thode repose sur le m\u00e9canisme de commande m\u00e9canique utilis\u00e9 dans tout le syst\u00e8me. Ainsi, l&#039;ic-SECM peut \u00eatre utilis\u00e9 m\u00eame dans des situations o\u00f9 une approche classique s&#039;av\u00e9rerait complexe, m\u00eame pour des utilisateurs exp\u00e9riment\u00e9s, par exemple lorsque le produit de corrosion de la surface est le m\u00e9diateur redox d&#039;int\u00e9r\u00eat.<\/p>\n<h3><strong>La topographie et l&#039;inclinaison ne sont plus un probl\u00e8me.<\/strong><\/h3>\n<p>L&#039;utilit\u00e9 de la microscopie \u00e9lectrochimique \u00e0 balayage (SECM) \u00e0 hauteur constante est limit\u00e9e si l&#039;\u00e9chantillon pr\u00e9sente d&#039;importantes variations topographiques et\/ou une forte inclinaison du fond. Dans ces cas, la difficult\u00e9 \u00e0 distinguer l&#039;effet de l&#039;activit\u00e9 de l&#039;\u00e9chantillon de celui de la topographie est mineure compar\u00e9e \u00e0 l&#039;ampleur des variations topographiques, qui ne permettent de mesurer qu&#039;un signal global dans certaines r\u00e9gions. Ceci peut consid\u00e9rablement restreindre les types et les tailles d&#039;\u00e9chantillons adapt\u00e9s \u00e0 la SECM \u00e0 hauteur constante. En revanche, la technique ic-SECM permet d&#039;analyser des \u00e9chantillons auparavant inaccessibles \u00e0 la SECM traditionnelle. L&#039;ic-SECM ouvre la voie \u00e0 la mesure de surfaces beaucoup plus vastes qu&#039;avec les m\u00e9thodes classiques, car elle suit l&#039;inclinaison de l&#039;\u00e9chantillon, \u00e9vitant ainsi la d\u00e9gradation du signal. En permettant \u00e0 la sonde de s&#039;approcher plus pr\u00e8s qu&#039;avec la mesure \u00e0 hauteur constante, l&#039;ic-SECM pr\u00e9sente l&#039;avantage suppl\u00e9mentaire d&#039;obtenir un signal plus intense.<\/p>","protected":false},"excerpt":{"rendered":"<p>Mesure l&#039;activit\u00e9 de surface et cartographie la topographie de surface<\/p>","protected":false},"featured_media":492,"template":"","meta":[],"product_brand":[550],"product_cat":[84],"product_tag":[],"document":[],"class_list":{"0":"post-491","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_brand-biologic","7":"product_cat-scanning-electrochemical-workstation","9":"first","10":"instock","11":"purchasable","12":"product-type-simple"},"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.8 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>ic-SECM - M470 - SnowHouse<\/title>\n<meta name=\"description\" content=\"ic-SECM technique&#039;s users can measure distinct surface activity, and surface topography maps\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/snowhouse.ca\/fr\/produit\/material-characterization\/scanning-electrochemical-workstation\/ic-secm470-intermittent-contact-scanning-electrochemical-microscopy\/\" \/>\n<meta property=\"og:locale\" content=\"fr_CA\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"ic-SECM - 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