CT 150

Compact Metrology System

SKU: CT 100 Category: Brand:

Description

CT 150 – Compact Metrology System for R&D and laboratories

Measurement Area: 148 x 148 mm²

Example Use-Cases: Substrates, electronic components, wafers up to 6“, other parts and components within measurement area

Advanced Table-Top Metrology

The CT150 is an excellent solution for R&D and failure analysis laboratories. Its adaptable design allows the integration of multiple sensors into a single system, supporting a wide range of applications.