Description
CESH-e – Controlled Environment Sample Holder
The Enhanced Controlled Environment Sample Holder (CESH-e) is a parallel plate sample holder dedicated to the electrical characterization of flat material samples in the temperature range between -40 to 150 °C..
A leak-tight sample holder for controlled atmosphere study
The Controlled Environment Sample Holder is a leak-tight (up to 2 bar relative) sample holder for the electrical characterization of hard, powdered, pasty and soft materials. Oxygen and moisture sensitive samples can be prepared in a glove box and then placed inside the CESH-e. The CESH-e can be used as standalone, or inside an ITS-e or a climate chamber.
Applications
- Electrical Impedance spectroscopy
- Dielectric constant / dielectric loss
- In-plane and through-plane electrical measurement
Specifications
- Operating temperature range – 40 to 150 °C
- Core material: Anodized aluminum
- Electrode material: Gold plated copper
- Dimension D 79 x H 94 mm (121.90 clearance)
- Sample diameter up to 30 mm
- Sample thickness up to 4 mm
- Residual capacitance with 20mm diameter= 8 pF
- Weight 900 g
