Products
- 3D Optical Profilometer
- 1. < 200x200mm Scan size
- 2. 300x300mm Scan size
- 3. 600x600mm Scan size
- 4. System for Round Samples
- 5. Choice of Sensor
- 6. Software
- AFM-IR
- Battery Cycler
- Environmental Monitoring
- Lab Equipment
- Microscope
- NanoScope
- Optical fibers
- Potentiostat / Galvanostat
- Radiation Measurements
- Scanning Probe Systems
- Scientific Cameras
- Spectrographs
- Spectrometers
- Stopped Flow Systems
- Vibration Isolation Systems
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- 14 July 2014
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- 24 Jan 2014
- January 24 2014
Lac-Beauport, SnowHouse Solutions has reached an agreement with Resolution Spectra (
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3D Optical Profilometer / 5. Choice of Sensor
3D Optical Profilometer /
5. Choice of Sensor (5 items / page 1 of 1)
- AREA SENSORS – 3D CONFOCAL MICROSCOPE
#3D CONFOCAL MICROSCOPE 3D CONFOCAL MICROSCOPE The 3D confocal microscope uses a rotating Nipkow Disk and offers 400 µm range and height resolution down to 1 nm. Light is focused through a spinning disk and the objective lens on the surface of the measurement. The holes on the disk serve as detecting pinholes to... - AREA SENSORS – 3D WHITE LIGHT INTERFEROMETER
#3D WLI 3D WHITE LIGHT INTERFEROMETER The 3D white light interferometers are available with 3 measurement ranges: 100 µm, 250 µm and 400 µm. The resolution in z-direction is 0.1 nm. The reflected light from an object surface is separated into a reference beam and an object beam. The light from the... - POINT SENSORS – Confocal White Light Sensor
#Confocal White Light Confocal White Light Sensor The CHR sensors are high end confocal sensors, based on the principal of chromatic aberration. They offer maximum accuracy and high speed. The sensors are available with various resolutions, ranges and numeric apertures. Light consisting of different wavelengths... - POINT SENSORS – INTERFEROMETER FOR THICKNESS MEASUREMENT
#INTERFEROMETER INTERFEROMETER FOR THICKNESS MEASUREMENT A white light interferometer measures the thickness of transparent materials and fims. It is based on the CHR controllers and can be combined with a CHR sensor head. Various infrared interferometers are available for measuring wafer thickness as well... - POINT SENSORS – LASER CONFOCAL AND LASER TRIANGULATION
#LASER CONFOCAL LASER CONFOCAL AND LASER TRIANGULATION The confocal laser sensor uses a blue laser source and is ideally for measuring solar cells. The sensor is available on all systems. The DSR-500 is ideal for measuring thick-film on a variety of substrates. It is available for the VANTAGE 50. A laser...