- 3D Optical Profilometer
- Research AFM
- Industrial AFM
- Options - Accessories
- Battery Cycler
- Environmental Monitoring
- Fuel Cell Tester
- Lab Equipment
- Laser Spectrum Analyzer
- Optical fibers
- Potentiostat / Galvanostat
- Radiation Measurements
- Scanning Probe Systems
- Scientific Cameras
- Stopped Flow Systems
- 14 July 2014
- Lac-Beauport, SnowHouse Solutions has reached an agreement with cyberTECHNOLOGIES (www.cybertechnologies.com) to promote... read more
AFM (16 items / page 2 of 2)
- 8. PARK XE-3DM - Automated Industrial AFM for High-Resolution 3D Metrology
#XE-3DM PARK XE-3DM - Automated Industrial AFM for High-Resolution 3D Metrology Park Systems has introduced the revolutionary XE-3DM, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY...
- 9. Park NX-PTR - Fully Automated AFM for Accurate Inline Metrology
#NX-PTR Park NX-PTR - The Fully Automated AFM for Accurate Inline Metrology of Hard Disk Head Sliders that makes doing great work simpler. Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level,...
- 91. PARK XE-PTR - Automated Industrial AFM for Metrology of Read/Write Heads
#XE-PTR PARK XE-PTR - Automated Industrial AFM for Metrology of Read / Write Heads Park Systems? XE-PTR is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano...
- 92. Park NX-WAFER - The only wafer fab AFM with automatic defect review
#NX-Wafer Park NX-WAFER - The only wafer fab AFM with automatic defect review Fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000% Park's Smart ADR provides fully automated defect review and identification, enabling a critical inline...
- 93. PARK XE-Wafer - Automated Industrial AFM for In-line Wafer Inspection and Metrology
#XE-Wafer PARK XE-Wafer - Automated Industrial AFM for In-line Wafer Inspection and Metrology Park Systems introduces the industry?s lowest-noise, fully automated industrial AFM, the XE-Wafer. The automated AFM system is designed for high resolution surface roughness, trench width, depth and angle measurements...
- PARK AFM OPTIONS
#AFM Options PARK AFM OPTIONS Easily customize our AFMs to fit your unique needs Because all of our AFMs use a modular, easy to modify design, we offer a large selection of options that let you customize your AFM to meet your individual needs. Now you can do better work and waste less time with a Park...
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