2. NanoScan - Compact

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NanoScan - Compact

Quantitative Characterization of Nanomechanical, Nanoindentation, Force Spectroscopy & Electrical properties in a compact cost-effective footprint.




Measurement Modes

- Imaging in contact dynamic scanning mode (topography / modulus mapping)..

- NanoIndentation / nanoscratch

- Force spectroscopy

- Mapping local conductivity simultaneously with surface topography and modulus mapping

- Measuring Current during instrumented nanoindentation and nanoscratch-test

- Measuring C-V curves at the predefined normal load/indentation penetration of the  nanoindenter  


SPM imaging module specification

- XY imaging range: 100um x 100um or larger

- Z imaging range: 10um or larger

- Displacement nonlinearity: 1 % or less


Samples stage specification

- Maximum space for samples: 100mm x 100mm x 60mm (please inquire for larger platforms)

- Maximum weight of samples: 3 kg

- XY positioning stage 50 x 50 mm (manual)


Measuring head specifications

- Peak load for low-range sensor: 30 mN 

- Maximum indentation displacement: 10um 



- Full set of software necessary for device setup and operation, as well as data acquisition and analysis.

- User manual



- Probe sensor with mounted diamond indenter (2 pcs.)

- Linear calibration grating TGZ02

- Hardness reference block (fused quartz)


PC workstation

- IBM compatible personal computer.

- Operating system: Windows 7 32bit / 64bit

- LCD display



- Interface to PC: USB 2.0 compatible


Acoustic enclosure

- Outside dimensions: 450mm x 400mm x 450mm

- Inside dimensions: 370mm x 310mm x 400mm

- Passive protection from noise and thermal effects


Download pdf brochure

Contact us for more details: info@snowhouse.ca

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NanoScan - Compact

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