M470- SECM- Scanning Probe Electrochemical Workstation

"The World's Most Advanced Scanning Probe Electrochemical Workstation"

The M470 is the brand new fourth generation of scanning probe electrochemical systems.  It introduces some new techniques to the marketplace and with a complete re-design of the scanning stages and electronics sets the benchmark by achieving the perfect balance of scan speed, resolution and accuracy to deliver the new gold standard in spatially resolved electrochemical measurement. Every element of the M470 is designed for the specific purpose of Scanning Probe Electrochemistry.

The M470 is a configurable system which will perform all the key scanning probe electrochemical techniques.

- Scanning Electrochemical Microscopy
- Alternating Current Scanning Electrochemical Microscopy
- Intermittent Contact Scanning Electrochemical Microscopy
- Scanning Vibrating Electrode Technique
- Scanning Kelvin Probe
- Localised Electrochemical Impedance Spectroscopy
- Scanning Droplet
- Alternating Current Scanning Droplet
- Non-contact surface profiling

The M470 utilises a new fast and precise, closed loop x, y, z positioning system with nanometer resolution, along with a flexible data acquisition system enabling the user to select the configuration most suited to their experiments. The system is designed with flexibility in mind and the design ergonomics ensure convenient cell, sample and probe access.