- 3D Optical Profilometer
- Battery Cycler
- Bench-Top Lasers
- Environmental Monitoring
- Fuel Cell Tester
- Lab Equipment
- Laser Spectrum Analyzer
- Nanomechanical Testers
- Optical fibers
- Potentiostat / Galvanostat
- Radiation Measurements
- Scanning Probe Systems
- Scientific Cameras
- Stopped Flow Systems
- 14 July 2014
- Lac-Beauport, SnowHouse Solutions has reached an agreement with cyberTECHNOLOGIES (www.cybertechnologies.com) to promote... read more
(297 items / page 8 of 33)
- 5. Shamrock 750 Spectrograph
#Shamrock 750 Shamrock 750 Spectrograph Pre-aligned, pre-calibrated detection solutions The Andor Shamrock SR-750 is the latest addition of the Andor family of spectrographs based on Czerny-Turner optical design. The Shamrock is available as a pre-aligned detector/spectrometer option allowing for seamless...
- 6. CT 350S
#CT 350S CT 350S - Non-Contact Profilometer - Large 350 mm x 350 mm scanning area - Large z-range at high resolution using a closed loop axis - User friendly - Sophisticated analysis and automation software The CT 350S is a non-contact profilometer with a 350 mm x-, y-scanning stage and a closed loop...
- 6. Mechelle 5000 Spectrograph
#Mechelle 5000 Mechelle 5000 Spectrograph The Best Price Performance Echelle Spectrograph Ever! Andor's new Mechelle ME5000 Echelle spectrograph has been designed to provide simultaneous recording of a wide wavelength range (200-975 nm) in one acquisition. It has no moving components is available in a pre-aligned...
- 7. CT 350T / Ct 250T
#CT 350T / Ct 250T CT 350T / CT 250T - Non-Contact Double-Sided Optical Profilometer - Scanning Range: up to 300 x 300 mm -áDual non-contact measurement system - 3D mapping of thickness, bow, warpage and rouhgness - User friendly concept - Sophisticated analysis and automation software The CT 350T is a non-contact...
- 7. PARK NX-HDM - AFM for automatic defect review and surface roughness measurement
#NX-HDM PARK NX-HDM - The Best AFM for automatic defect review and surface roughness measurement Higher Throughput, Automatic Defect Review The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force...
- 7. Sol 2.2A - TE Cooled InGaAs Array Spectrometer (2.2 Ám)
#Sol 2.2A Sol 2.2A - TE Cooled InGaAs Array Spectrometer (2.2 Ám) The Sol? 2.2A NIR spectrometer is a high performance linear InGaAs array spectrometer with an available spectral range of 900-2200nm. Its 256 pixel detector provides high throughput and large dynamic range with TE Cooling down to -15oC...
- 71. Park NX-Hivac
#NX-HIVAC Park NX-Hivac High vacuum atomic force microscope for failure analysis Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy,...
- 8. CT 600S
#CT 600S CT 600S - Non-Contact Profilometer - Large 600 mm x 600 mm scanning area - High accurate measurements on large and heavy parts - User friendly concept - Sophisticated analysis and automation software The CT 600S is a non-contact profilometer with a 600 mm x-, y-motion system. The gantry design...
- 8. PARK XE-3DM - Automated Industrial AFM for High-Resolution 3D Metrology
#XE-3DM PARK XE-3DM - Automated Industrial AFM for High-Resolution 3D Metrology Park Systems has introduced the revolutionary XE-3DM, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY...
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